Circuit Simulation for Fault Sensitivity Analysis and Its Application to Cryptographic LSI.

Takeshi Sugawara Daisuke Suzuki Toshihiro Katashita

Published in: FDTC (2012)

Keyphrases

sensitivity analysis
managerial insights
variational inequalities
latent semantic indexing
influence diagrams
simulation model
mathematical model
fault detection
text retrieval
smart card
circuit design
high speed
rbfnn
expert systems
discrete event
failure modes
viewpoint