Leakage-Based Digital Temperature Sensor With Supply Sensitivity Suppression in 55-nm CMOS.
Zhong TangYun FangZheng ShiXiao-Peng YuNianxiong TanWeiwei PanPublished in: IEEE J. Solid State Circuits (2020)
Keyphrases
- cmos image sensor
- metal oxide semiconductor
- image sensor
- high sensitivity
- analog to digital converter
- circuit design
- cmos technology
- solid state
- dynamic range
- metal oxide
- low cost
- low voltage
- leakage current
- mixed signal
- single chip
- heat flow
- power consumption
- sensor data
- real time
- silicon on insulator
- low power
- sensor networks
- focal plane
- sensor fusion
- nm technology
- charge coupled device
- integrated circuit
- parallel processing
- high temperature
- vlsi circuits
- imaging systems
- digital content
- sensitivity analysis