Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing.

Dennis Noll Udo Schwalke

Published in: DTIS (2019)

Keyphrases

field effect transistors
schottky barrier
genetic algorithm
key issues
real time
steady state
highly reliable
reliability analysis
database
neural network
machine learning
database systems
sensor networks
semiconductor devices
knowledge base
failure rate