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Simulation of spatial fault distributions for integrated circuit yield estimations.
Charles H. Stapper
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
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integrated circuit
spatio temporal
spatial data
spatial information
mathematical model
fault diagnosis
spatial and temporal
spatial distribution
probability distribution
high speed
pattern recognition
geographic information systems
fault detection
massively parallel
electron beam