An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits.

Dhruva R. Chakrabarti Ajai Jain

Published in: VLSI Design (1996)

Keyphrases

image data
test generation
high speed
image quality
delay insensitive
analog circuits
design automation
circuit design
test sequences
information systems
decision trees
case study
cooperative
information technology
test cases
software testing