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RP-SYN: synthesis of random pattern testable circuits with test point insertion.
Nur A. Touba
Edward J. McCluskey
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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analog circuits
data sets
test cases
pattern matching
statistical tests
random graphs
logic synthesis
case study
high speed
uniformly distributed
quantum computing