Login / Signup

RP-SYN: synthesis of random pattern testable circuits with test point insertion.

Nur A. ToubaEdward J. McCluskey
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
  • analog circuits
  • data sets
  • test cases
  • pattern matching
  • statistical tests
  • random graphs
  • logic synthesis
  • case study
  • high speed
  • uniformly distributed
  • quantum computing