Login / Signup
A Built-In-Test Circuit for RF Differential Low Noise Amplifiers.
Lambros Dermentzoglou
Angela Arapoyanni
Yiorgos Tsiatouhas
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2010)
Keyphrases
</>
low signal to noise ratio
high noise
relevance feedback
noise level
image noise
radio frequency
test cases
missing data
high levels
noisy environments
high speed
noisy data
random noise
signal noise ratio
information retrieval
noise sensitivity
noise model
image structure
noise reduction
evolutionary algorithm