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Detectability Challenges of Bridge Defects in FinFET Based Logic Cells.
Freddy Forero
Jean Marc Gallière
Michel Renovell
Víctor H. Champac
Published in:
J. Electron. Test. (2018)
Keyphrases
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lessons learned
key issues
logic programming
technical challenges
classical logic
logic programs
image quality
multi valued
asynchronous circuits
real world
learning algorithm
feature extraction
open issues
stem cell
defect classification