Detectability Challenges of Bridge Defects in FinFET Based Logic Cells.

Freddy Forero Jean Marc Gallière Michel Renovell Víctor H. Champac

Published in: J. Electron. Test. (2018)

Keyphrases

lessons learned
key issues
logic programming
technical challenges
classical logic
logic programs
image quality
multi valued
asynchronous circuits
real world
learning algorithm
feature extraction
open issues
stem cell
defect classification