Accelerated Test Points Selection Method for Scan-Based BIST.
Michinobu NakaoKazumi HatayamaIsao HigashiPublished in: Asian Test Symposium (1997)
Keyphrases
- mutual information
- experimental evaluation
- segmentation method
- high accuracy
- detection method
- dynamic programming
- optical flow
- input data
- cost function
- significant improvement
- pairwise
- test data
- similarity measure
- computer vision
- selection strategy
- classification method
- high precision
- selection algorithm
- edge detection
- computational cost
- prior knowledge
- feature space
- computational complexity
- objective function
- multiscale
- decision trees