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Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature.

Sebastien BernardMarc BellevilleAlexandre ValentianJean-Didier LegatDavid Bol
Published in: PATMOS (2014)
Keyphrases
  • electric field
  • flip flops
  • room temperature
  • cmos technology
  • multiple input
  • low voltage
  • metal oxide
  • operating point
  • control system
  • power system
  • transmission line
  • electrical power