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A BIST Scheme for FPGA Interconnect Delay Faults.

Chun-Chieh WangJing-Jia LiouYen-Lin PengChih-Tsun HuangCheng-Wen Wu
Published in: VTS (2005)
Keyphrases
  • high speed
  • built in self test
  • test cases
  • fault diagnosis
  • low power
  • power dissipation
  • neural network
  • expert systems
  • wavelet transform
  • fault detection
  • hardware design
  • real time image processing