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Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation.

Anis UzzamanBibo LiThomas J. SnethenBrion L. KellerGary Grise
Published in: ITC (2007)
Keyphrases
  • knowledge base
  • image processing
  • general purpose
  • low cost
  • product design
  • generation algorithm
  • data sets
  • information systems
  • artificial neural networks
  • life cycle
  • semi automated
  • generation process