Analog test metrics estimates with PPM accuracy.
Haralampos-G. D. StratigopoulosSalvador MirPublished in: ICCAD (2010)
Keyphrases
- high accuracy
- prediction accuracy
- classification accuracy
- error rate
- real time
- sufficiently accurate
- estimation error
- confidence estimates
- high precision
- precision and recall
- fold cross validation
- statistical significance
- compression algorithm
- random selection
- measurement error
- accuracy rate
- evaluation metrics
- information gain
- test data
- low cost
- machine learning
- neural network