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Acceleration of trace-based fault simulation of combinational circuits.

Ohyoung SongPremachandran R. Menon
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
  • fault diagnosis
  • fault detection
  • asynchronous circuits
  • data mining
  • genetic algorithm
  • high speed
  • simulation model
  • logic circuits
  • data sets
  • machine learning
  • case study
  • low cost
  • simulation study
  • fault model