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Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs.

Brandon NoiaKrishnendu ChakrabartySandeep Kumar GoelErik Jan MarinissenJouke Verbree
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • single machine
  • real world
  • web services
  • real time
  • neural network
  • knowledge base
  • multi agent systems
  • optimization algorithm
  • test data
  • software architecture
  • optimization process
  • software testing