Transistor sizing in lithography-aware regular fabrics.

Felipe S. Marranghello Vinícius Dal Bem André Inácio Reis Francesc Moll Renato P. Ribas

Published in: SBCCI (2011)

Keyphrases

integrated circuit
electron beam
high speed
defect detection
power losses
neural network
machine learning
learning algorithm
data structure
low power
context free
regular patterns