Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately.
Takuya HoshiiKazuyoshi FurukawaKuniyuki KakushimaMasahiro WatanabeNaoyuki ShigvoTakuya SarayaToshihiko TakakuraKazuo ItouMunetoshi FukuiShinichi SuzukiKiyoshi TakeuchiIriya MunetaHitoshi WakabayashiShinichi NishizawaKazuo TsutsuiToshiro HiramotoHiromichi OhashiHiroshi LwaiPublished in: ESSDERC (2018)