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An Approach to Locate Parametric Faults in Nonlinear Analog Circuits.

Yong DengYibing ShiWei Zhang
Published in: IEEE Trans. Instrum. Meas. (2012)
Keyphrases
  • analog circuits
  • fault diagnosis
  • fault detection
  • neural network
  • digital circuits
  • expert systems
  • wavelet packet transform
  • fuzzy logic
  • model based diagnosis
  • multiple faults
  • pattern recognition
  • np hard
  • low power