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Black box delay fault models for non-scan sequential circuits.

Eduardas BareisaVacius JusasKestutis MotiejunasLiudas MotiejunasRimantas Seinauskas
Published in: Comput. Sci. Inf. Syst. (2018)
Keyphrases
  • black box
  • fault models
  • model based diagnosis
  • black boxes
  • fault management
  • horn clauses
  • conflict resolution
  • fault model
  • integration testing
  • white box
  • white box testing
  • dynamic systems
  • neural network
  • fault tolerance