Login / Signup
A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test.
V. R. Devanathan
C. P. Ravikumar
V. Kamakoti
Published in:
ITC (2007)
Keyphrases
</>
pattern generation
main contribution
optimization scheme
real time
markov chain
data sets
web services
image sequences
query language
optimization problems
lightweight
optimization method
convex optimization
optimization methods
statistical tests