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A Multi-dimensional Pattern Run-Length Method for Test Data Compression.
Lung-Jen Lee
Wang-Dauh Tseng
Rung-Bin Lin
Chen-Lun Lee
Published in:
Asian Test Symposium (2009)
Keyphrases
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test data
multi dimensional
similarity measure
test cases
test set
training data
error rate
run length
gray level
detection method
computer vision
training set
input image