A Multi-dimensional Pattern Run-Length Method for Test Data Compression.

Lung-Jen Lee Wang-Dauh Tseng Rung-Bin Lin Chen-Lun Lee

Published in: Asian Test Symposium (2009)

Keyphrases

test data
multi dimensional
similarity measure
test cases
test set
training data
error rate
run length
gray level
detection method
computer vision
training set
input image