Self-heating Induced Variability and Reliability in Advanced Logic Devices and Circuits.
Xiaoyan LiuWangyong ChenLinlin CaiGang DuXing ZhangPublished in: ASICON (2019)
Keyphrases
- floating gate
- logic synthesis
- delay insensitive
- digital circuits
- logic circuits
- asynchronous circuits
- chip design
- mobile devices
- random access memory
- highly reliable
- multi valued
- classical logic
- built in self test
- low power
- quantum computing
- energy consumption
- logic programming
- neural network
- intra class
- inference rules
- reliability analysis
- deontic logic
- personal computer
- modal logic
- fault models
- high speed
- real time