Reducing Test Power, Time and Data Volume in SoC Testing Using Selective Trigger Scan Architecture.
Shervin SharifiMohammad HosseinabadyPedram A. RiahiZainalabedin NavabiPublished in: DFT (2003)
Keyphrases
- data sets
- data analysis
- synthetic data
- training data
- raw data
- test data
- data collection
- data processing
- neural network
- missing data
- data sources
- data points
- statistical tests
- data quality
- sensor data
- input data
- management system
- image data
- prior knowledge
- high quality
- decision trees
- social networks
- data mining
- relational databases
- high dimensional
- data structure
- volume data