Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation.
Shotaro SugitaniRyuichi NakajimaTakafumi ItoJun FurutaKazutoshi KobayashiMathieu LouvatFrancois JacquetJean-Christophe EloyOlivier MontfortLionel JureVincent HuardPublished in: IOLTS (2023)