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ST-YOLO: An Improved Metal Defect Detection Model Based on Yolov5.

Sijin SunMing DengJiawei LuoXiaohang ZhengYang Pan
Published in: CACML (2024)
Keyphrases
  • defect detection
  • automated visual inspection
  • feature extraction
  • data driven
  • databases
  • neural network
  • high level
  • artificial neural networks
  • model free
  • high temperature