Towards Zero-Defect Manufacturing in the Silicon Wafer Production Through Calibration Measurement Process: An Italian Case.
Federica AcerbiAndrea PranzoCristina SannaMarco SpaltiniMarco TaischPublished in: PLM (2) (2023)
Keyphrases
- manufacturing process
- semiconductor manufacturing
- manufacturing processes
- quality control
- process planning
- raw material
- production process
- process control
- camera calibration
- production planning
- computer vision
- decision making
- machine vision
- production line
- data acquisition
- steady state
- process model
- control system
- neural network
- manufacturing industry