A configurable bus-tracer for error reproduction in post-silicon validation.

Shing-Yu Chen Ming-Yi Hsiao Wen-Ben Jone Tien-Fu Chen

Published in: VLSI-DAT (2013)

Keyphrases

high speed
error rate
low cost
computer vision
three dimensional
error bounds
high density
neural network
data mining
machine learning
artificial intelligence
search engine
false positives
estimation error
approximation error
silicon dioxide