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[131] Experimental study of the short-circuit robustness of 600 V E-mode GaN transistors.
M. Landel
C. Gautier
Denis Labrousse
Stéphane Lefebvre
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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experimental study
short circuit
thin film
experimental evaluation
power consumption
high density
real time
image processing
real life
object oriented
fault diagnosis