M. Landel

Publication Activity (10 Years)

Years Active: 2016-2016
Publications (10 Years): 1

Top Topics

Experimental Study

Top Venues

Microelectron. Reliab.

Publications

M. Landel, C. Gautier, Denis Labrousse, Stéphane Lefebvre
[131] Experimental study of the short-circuit robustness of 600 V E-mode GaN transistors. Microelectron. Reliab. 64 (2016)