Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks.
Biswajit BhowmikPublished in: J. Electron. Test. (2020)
Keyphrases
- communication networks
- built in self test
- wireless communication
- wireless channels
- test cases
- distributed databases
- data transmission
- network structure
- communication infrastructure
- fault diagnosis
- computer networks
- smart grid
- ip networks
- high density
- databases
- multi channel
- high speed
- data mining
- intelligent agents
- information systems
- email communication
- artificial intelligence