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At-Speed Transition Fault Testing With Low Speed Scan Enable.

Nisar AhmedC. P. RavikumarMohammad TehranipoorJim Plusquellic
Published in: VTS (2005)
Keyphrases
  • high speed
  • real time
  • neural network
  • databases
  • information retrieval
  • computer vision
  • expert systems
  • probability distribution
  • software engineering
  • fault detection
  • scan data