Metric Learning for Patch-Based 3-D Image Registration.
Shao-peng LiTao ZhangDaqiao ZhangYongfang NieJiping WangPublished in: IEEE Trans Autom. Sci. Eng. (2019)
Keyphrases
- metric learning
- image registration
- distance metric
- distance metric learning
- learning tasks
- pairwise
- mutual information
- semi supervised
- machine learning and pattern recognition
- nearest neighbor classification
- dimensionality reduction
- semi supervised clustering
- multi task
- image matching
- distance function
- mahalanobis metric
- machine learning
- image patches
- maximum variance unfolding
- subject to linear constraints
- semi supervised learning
- feature space
- data points
- pattern recognition
- background knowledge
- labeled data
- image processing
- neural network