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DFT Infrastructure for Broadside Two-Pattern Test of Core-Based SOCs.

Qiang XuNicola Nicolici
Published in: IEEE Trans. Computers (2006)
Keyphrases
  • pattern matching
  • frequency domain
  • fourier transform
  • real time
  • test cases
  • test data
  • statistical tests
  • case study
  • data structure
  • denoising
  • computing environments
  • statistical significance