An Inductive-Coupling DC Voltage Transceiver for Highly Parallel Wafer-Level Testing.
Yoichi YoshidaKoichi NoseYoshihiro NakagawaKoichiro NoguchiYasuhiro MoritaMasamoto TagoMasayuki MizunoTadahiro KurodaPublished in: IEEE J. Solid State Circuits (2010)