Novel machine learning-based prediction approach for nanoindentation load-deformation in a thin film: Applications to electronic industries.
Sujal Laxmikant VajireAbhishek Prashant SinghDinesh Kumar SainiAnoop Kumar MukhopadhyayKulwant SinghDhaneshwar MishraPublished in: Comput. Ind. Eng. (2022)
Keyphrases
- thin film
- machine learning
- high density
- prediction accuracy
- short circuit
- load forecasting
- data mining
- solar cell
- information technology
- prediction model
- multi layer
- learning algorithm
- databases
- electron microscopy
- active learning
- grain size
- decision trees
- white light interferometry
- spatial distribution
- learning tasks
- chemical vapor deposition