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Growth and quality control of MBE-based SiGe-HBT for amplifier applications.
Daoguang Liu
Siliu Xu
Kaicheng Li
Jin Zhang
Rongkan Liu
Yukui Liu
Zhengfan Zhang
Gangyi Hu
Yue Hao
Published in:
Microelectron. J. (2003)
Keyphrases
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quality control
machine vision
quality assurance
product quality
manufacturing process
manufacturing systems
high sensitivity
automated visual inspection
machine learning
thin film
dual channel
real time
case study
software engineering
oil field