in Metal-Gate Capacitors.

Yanli Pei Hideki Murakami Seiichiro Higashi Seiichi Miyazaki Seiji Inumiya Yasuo Nara

Published in: IEICE Trans. Electron. (2007)

Keyphrases

field effect transistors
high density
steady state
metal oxide
mathematical analysis
integrated circuit
short circuit
multiple input
x ray
grain size
database systems
data center
decision making
markov chain
high temperature
nano scale
welding process