A SMT-based diagnostic test generation method for combinational circuits.
Sarvesh PrabhuMichael S. HsiaoLoganathan LingappanVijay GangaramPublished in: VTS (2012)
Keyphrases
- generation method
- diagnostic tests
- asynchronous circuits
- logic circuits
- feature generation
- high speed
- vlsi circuits
- low power
- website
- expert systems
- statistical machine translation
- software testing
- logic synthesis
- diagnostic reasoning
- data sets
- statistical significance
- statistical tests
- case study
- artificial intelligence
- genetic algorithm