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CRIS: a test cultivation program for sequential VLSI circuits.

Daniel G. SaabYoussef SaabJacob A. Abraham
Published in: ICCAD (1992)
Keyphrases
  • vlsi circuits
  • test cases
  • low power
  • computer programs
  • set of test cases
  • multimedia
  • case study
  • power consumption
  • parallel processing
  • test suite
  • multiple choice
  • mixed signal