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Native Mode Functional Self-Test Generation for Systems-on-Chip.

Kamalnayan JayaramanVivekananda M. VedulaJacob A. Abraham
Published in: ISQED (2002)
Keyphrases
  • test generation
  • low cost
  • high speed
  • complex systems
  • test sequences
  • data sets
  • databases
  • bit rate
  • design automation