A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation.
Sho EndoYang LiNaofumi HommaKazuo SakiyamaKazuo OhtaDaisuke FujimotoMakoto NagataToshihiro KatashitaJean-Luc DangerTakafumi AokiPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2015)