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A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation.

Sho EndoYang LiNaofumi HommaKazuo SakiyamaKazuo OhtaDaisuke FujimotoMakoto NagataToshihiro KatashitaJean-Luc DangerTakafumi Aoki
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • sensitivity analysis
  • influence diagrams
  • managerial insights
  • low cost
  • evaluation method
  • variational inequalities
  • multi objective
  • higher level
  • fault detection
  • image sequences
  • evolutionary algorithm