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A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard.
Wimol San-Um
Masayoshi Tachibana
Published in:
IEICE Trans. Inf. Syst. (2010)
Keyphrases
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analog circuits
fault diagnosis
neural network
expert systems
wavelet packet transform
fault model
query language
object oriented
knowledge acquisition
constraint satisfaction
fault detection
blind signature scheme