Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology.
Meghna MadhusudanJitesh PoojaryArvind K. SharmaRamprasath SKishor KunalSachin S. SapatnekarRamesh HarjaniPublished in: ESSDERC (2023)
Keyphrases
- analog circuits
- digital circuits
- fault diagnosis
- cost effective
- future development
- rapid development
- distance measure
- view angle
- key technologies
- distance transform
- machine learning
- neural network
- complex systems
- data processing
- constraint satisfaction
- fuzzy logic
- image processing
- information systems
- artificial intelligence
- sensemaking
- real time