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Switch-level delay test of domino logic circuits.

Suriyaprakash NatarajanSandeep K. GuptaMelvin A. Breuer
Published in: ITC (2001)
Keyphrases
  • logic circuits
  • low power
  • high speed
  • power dissipation
  • neural network
  • real time
  • gate array
  • signal processing
  • functional decomposition
  • tunnel diode