Automated nanoprobing under scanning electron microscopy.
Zheng GongBrandon K. ChenJun LiuYu SunPublished in: ICRA (2013)
Keyphrases
- electron microscopy
- low energy
- x ray
- image stacks
- thin film
- semi automated
- fully automated
- microscopy images
- computer aided
- image processing
- fully automatic
- neural network
- structured light
- semi automatic
- building blocks
- artificial neural networks
- three dimensional
- image segmentation
- tubular structures
- scan data
- transmission electron microscopy