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Effective parallel processing techniques for the generation of test data for a logic built-in self test system.
Paul Chang
Brion L. Keller
Sarala Paliwal
Published in:
Asian Test Symposium (2000)
Keyphrases
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parallel processing
test data
training data
test cases
computational power
distributed processing
processing speed
test set
training set
built in self test
pc cluster
databases
high resolution
parallel computers