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Effective parallel processing techniques for the generation of test data for a logic built-in self test system.

Paul ChangBrion L. KellerSarala Paliwal
Published in: Asian Test Symposium (2000)
Keyphrases
  • parallel processing
  • test data
  • training data
  • test cases
  • computational power
  • distributed processing
  • processing speed
  • test set
  • training set
  • built in self test
  • pc cluster
  • databases
  • high resolution
  • parallel computers