Exponential Asymptotics for Thin Film Rupture.

S. Jonathan Chapman Philippe H. Trinh Thomas P. Witelski

Published in: SIAM J. Appl. Math. (2013)

Keyphrases

thin film
high density
multi layer
grain size
short circuit
solar cell
sufficient conditions
room temperature
neural network
expert systems
markov chain
electron microscopy
low power
magnetic field
film thickness
chemical vapor deposition