Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.
Jens WarmuthKay-Uwe GieringAndré LangeAndré ClausnerSimon SchlipfGottfried KurzMichael OttoJens PaulRoland JanckeAndreas AalMartin GallEhrenfried ZschechPublished in: ESSDERC (2018)