Low-Temperature Activation in Boron Ion-Implanted Silicon by Soft X-Ray Irradiation.
Akira HeyaNaoto MatsuoKazuhiro KandaPublished in: IEICE Trans. Electron. (2016)
Keyphrases
- x ray
- transmission electron microscopy
- electron beam
- electron microscope
- intraoperative
- x ray images
- medical imaging
- digital x ray images
- ct volume
- electron microscopy
- projection images
- three dimensional
- fiducial markers
- high speed
- small animal
- tomographic images
- ct scans
- high density
- dual energy
- cone beam ct
- chest radiographs
- guide wire
- fluoroscopic images