Login / Signup
A low overhead design for testability and test generation technique for core-based systems-on-a-chip.
Indradeep Ghosh
Niraj K. Jha
Sujit Dey
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
</>
design automation
test generation
low overhead
low cost
circuit design
case study
design process
test cases
embedded systems
real time
data sets
image processing